Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes

Carlo De Santi, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni. Degradation of InGaN laser diodes caused by temperature- and current-driven diffusion processes. Microelectronics Reliability, 64:623-626, 2016. [doi]

Abstract

Abstract is missing.