Marcelino B. Santos, Fernando M. Gonçalves, Michael J. Ohletz, João Paulo Teixeira. Defect-oriented testing of analogue and mixed signal ICs. In 5th IEEE International Conference on Electronics, Circuits and Systems, ICECS 1998, Surfing the Waves of Science and Technology, Lisbon, Portugal, September 7-10, 1998 . pages 419-424, IEEE, 1998. [doi]
Abstract is missing.