Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. RTL-based functional test generation for high defects coverage in digital SOCs. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 99-104, IEEE Computer Society, 2000. [doi]
Abstract is missing.