Alexandre Sarafianos, Mathieu Lisart, Olivier Gagliano, Valerie Serradeil, Cyril Roscian, Jean-Max Dutertre, Assia Tria. Robustness improvement of an SRAM cell against laser-induced fault injection. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 149-154, IEEE, 2013. [doi]
@inproceedings{SarafianosLGSRDT13,
title = {Robustness improvement of an SRAM cell against laser-induced fault injection},
author = {Alexandre Sarafianos and Mathieu Lisart and Olivier Gagliano and Valerie Serradeil and Cyril Roscian and Jean-Max Dutertre and Assia Tria},
year = {2013},
doi = {10.1109/DFT.2013.6653598},
url = {http://dx.doi.org/10.1109/DFT.2013.6653598},
researchr = {https://researchr.org/publication/SarafianosLGSRDT13},
cites = {0},
citedby = {0},
pages = {149-154},
booktitle = {2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013},
publisher = {IEEE},
}