Fast Adversarial Robustness Certification of Nearest Prototype Classifiers for Arbitrary Seminorms

Sascha Saralajew, Lars Holdijk, Thomas Villmann. Fast Adversarial Robustness Certification of Nearest Prototype Classifiers for Arbitrary Seminorms. In Hugo Larochelle, Marc'Aurelio Ranzato, Raia Hadsell, Maria-Florina Balcan, Hsuan-Tien Lin, editors, Advances in Neural Information Processing Systems 33: Annual Conference on Neural Information Processing Systems 2020, NeurIPS 2020, December 6-12, 2020, virtual. 2020. [doi]

Abstract

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