P. Saraza-Canflanca, Javier Diaz-Fortuny, A. Toro-Frias, R. Castro-López, Elisenda Roca, Javier Martín-Martínez, R. Rodrigucz, Montserrat Nafría, Francisco V. Fernández. Automated Massive RTN Characterization Using a Transistor Array Chip. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 29-32, IEEE, 2018. [doi]
Abstract is missing.