P. Saraza-Canflanca, Javier Diaz-Fortuny, R. Castro-López, Elisenda Roca Moreno, Javier Martín-Martínez, Rosana Rodriguez, Montserrat Nafria, Francisco V. Fernandez. New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 150-155, IEEE, 2019. [doi]
@inproceedings{Saraza-Canflanca19,
title = {New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors},
author = {P. Saraza-Canflanca and Javier Diaz-Fortuny and R. Castro-López and Elisenda Roca Moreno and Javier Martín-Martínez and Rosana Rodriguez and Montserrat Nafria and Francisco V. Fernandez},
year = {2019},
doi = {10.23919/DATE.2019.8715029},
url = {https://doi.org/10.23919/DATE.2019.8715029},
researchr = {https://researchr.org/publication/Saraza-Canflanca19},
cites = {0},
citedby = {0},
pages = {150-155},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019},
publisher = {IEEE},
isbn = {978-3-9819263-2-3},
}