Texture Defect Detection Using Independent Vector Analysis in Wavelet Domain

Leda Sari, Aysin Ertüzün. Texture Defect Detection Using Independent Vector Analysis in Wavelet Domain. In 22nd International Conference on Pattern Recognition, ICPR 2014, Stockholm, Sweden, August 24-28, 2014. pages 1639-1644, IEEE, 2014. [doi]

Abstract

Abstract is missing.