Hari Sarkar, Sudakshina Kundu. Standby leakage current estimation model for multi threshold CMOS inverter circuit in deep submicron technology. In 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. pages 1-6, IEEE, 2015. [doi]
Abstract is missing.