Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection - researchr publication authors

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Sébastien Sarrazin, Samuel Evain, Lirida Alves de Barros Naviner, Yannick Bonhomme, Valentin Gherman. Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1077-1082, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

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