Jos van Sas, Geert van Wauwe, Erik Huyskens, Dirk Rabaey. BIST for Embedded Static RAMs with Coverage Calculation. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 339-348, IEEE Computer Society, 1993.
Abstract is missing.