Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors

Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu. Accurate Array-Based Measurement for Subthreshold-Current of MOS Transistors. J. Solid-State Circuits, 44(11):2977-2986, 2009. [doi]

Abstract

Abstract is missing.