Saswata Satpathi, Sourav Bagchi, Aurobinda Routray, Partha Sarathi Satpathi, Ritwik Dash. Adaptive Change Detection of the temperature pattern of the face for identifying deceit. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.