Application of Guided Wave Technology and DSP Techniques for Fault Detection and Characterization

Christopher Sauer, Vahid Emamian. Application of Guided Wave Technology and DSP Techniques for Fault Detection and Characterization. In 2nd IEEE International Conference on System of Systems Engineering, SoSE 2007, San Antonio, TX, USA, 16-18 April 2007. pages 1-5, IEEE, 2007. [doi]

Abstract

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