Puneet Ramesh Savanur, Spyros Tragoudas. Threshold Voltage Extraction Using Static NBTI Aging. In 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.