A Pragmatic Approach to the Design of Self-Testing Circuits - researchr publication

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Yvon Savaria, Bruno Laguë, Bozena Kaminska. A Pragmatic Approach to the Design of Self-Testing Circuits. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 745-754, IEEE Computer Society, 1989.

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