Valeria L. Scarano, Marcantonio Catelani, Andrea Carignano, Daniele Mazzei, Giacomo Baldi. Design and development of an accelerated testing architecture for embedded systems fault monitoring. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2013, Minneapolis, MN, USA, May 6-9, 2013. pages 1590-1593, IEEE, 2013. [doi]
Abstract is missing.