Crystal Barker Schaaf, Alan H. Strahler, Feng Gao 0009, Wolfgang Lucht, Yufang Jin, Xiaowen Li, Xiaoyang Zhang, Elena Tsvetsinskaya, Jan-Peter Muller, Philip Lewis, Michael J. Barnsley, Gareth Roberts, Christopher Doll, Shunlin Liang, David P. Roy, Jeffrey L. Privette. Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2002, Toronto, Ontario, Canada, 24-28 June 2002. pages 1188-1190, IEEE, 2002. [doi]
Abstract is missing.