Patrick Scharf, Christoph Sohrmann, Steffen Holland, Volkhard Beyer. Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 226-229, IEEE, 2019. [doi]
Abstract is missing.