Omar Schiaratura, Pietro Ansaloni, Giovanni Lughi, Mattia Neri, Matteo Roffilli, Fabrizio Serpi, Andrea Simonetto. SoC-Based Pattern Recognition Systems for Non Destructive Testing. In Panos M. Pardalos, Mario Pavone, Giovanni Maria Farinella, Vincenzo Cutello, editors, Machine Learning, Optimization, and Big Data - First International Workshop, MOD 2015, Taormina, Sicily, Italy, July 21-23, 2015, Revised Selected Papers. Volume 9432 of Lecture Notes in Computer Science, pages 209-221, Springer, 2015. [doi]
Abstract is missing.