Tobias Schiele, Andreas Jansche, Timo Bernthaler, Anton Kaiser, Daniel Pfister, Stefan Späth-Stockmeier, Christian Hollerith. Comparison of deep learning-based image segmentation methods for the detection of voids in X-ray images of microelectronic components. In 17th IEEE International Conference on Automation Science and Engineering, CASE 2021, Lyon, France, August 23-27, 2021. pages 1320-1325, IEEE, 2021. [doi]
Abstract is missing.