Christian Schlünder, Katja Waschneck, Peter Rotter, Susanne Lachenmann, Hans Reisinger, Franz Ungar, Georg Georgakos. From Device Aging Physics to Automated Circuit Reliability Sign Off. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-12, IEEE, 2019. [doi]
Abstract is missing.