R. B. Schvittz, M. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, L. S. da Rosa, Paulo F. Butzen. Reliability evaluation of circuits designed in multi- and single-stage versions. In 9th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2018, Puerto Vallarta, Mexico, February 25-28, 2018. pages 1-4, IEEE, 2018. [doi]
Abstract is missing.