An extension of the Q diversity metric from single-label to multi-label and multi-ranking Multiple Classifier Systems for pattern classification

Filippo Sciarrone. An extension of the Q diversity metric from single-label to multi-label and multi-ranking Multiple Classifier Systems for pattern classification. In International Conference on Machine Learning and Cybernetics, ICMLC 2012, Xian, Shaanxi, China, July 15-17, 2012, Proceedings. pages 6-10, IEEE, 2012. [doi]

Abstract

Abstract is missing.