A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy

Abu Sebastian, Anil Gannepalli, Murti V. Salapaka. A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy. IEEE Trans. Contr. Sys. Techn., 15(5):952-959, 2007. [doi]

Abstract

Abstract is missing.