Nicu Sebe, Michael S. Lew, Dionysius P. Huijsmans. Which ranking metric is optimal? With applications in image retrieval and stereo matching. In Anil K. Jain, Svetha Venkatesh, Brian C. Lovell, editors, Fourteenth International Conference on Pattern Recognition, ICPR 1998, Brisbane, Australia, 16-20 August, 1998. pages 265-271, IEEE, 1998. [doi]
Abstract is missing.