Saalini V. Sekar, Haibo Cao, Robert J. Weber. Changes in dc current bias as a function of input drive for a depletion mode SiC MESFET. In 2008 IEEE International Conference on Electro/Information Technology, EIT 2008, held at Iowa State University, Ames, Iowa, USA, May 18-20, 2008. pages 367-371, IEEE, 2008. [doi]
Abstract is missing.