Sudhanshu Kumar Semwal, Charulata K. Kearney, J. M. Mashell. The Slicing Extent Technique for Ray Tracing: Isolating Sparse and Dense Areas. In Sudhir P. Mudur, Sumanta N. Pattanaik, editors, Graphics, Design and Visualization, Proceedings of the IFIP TC5/WG5.2/WG5.10 CSI International Conference on Computer Graphics - ICCG93, Bombay, India, 24-26 February, 1993. Volume B-9 of IFIP Transactions, pages 115-122, North-Holland, 1993.
Abstract is missing.