A scan shifting method based on clock gating of multiple groups for low power scan testing - researchr publication

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Sungyoul Seo, Yong Lee 0002, Joohwan Lee, Sungho Kang. A scan shifting method based on clock gating of multiple groups for low power scan testing. In Sixteenth International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA, March 2-4, 2015. pages 162-166, IEEE, 2015. [doi]

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