Sungyoul Seo, Yong Lee 0002, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang. Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{Seo0LLYKK15, title = {Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction}, author = {Sungyoul Seo and Yong Lee 0002 and Hyeonchan Lim and Joohwan Lee and Hongbom Yoo and Yojoung Kim and Sungho Kang}, year = {2015}, doi = {10.1109/ATS.2015.8}, url = {http://dx.doi.org/10.1109/ATS.2015.8}, researchr = {https://researchr.org/publication/Seo0LLYKK15}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015}, publisher = {IEEE}, isbn = {978-1-4673-9739-1}, }