Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction

Sungyoul Seo, Yong Lee 0002, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang. Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 1-6, IEEE, 2015. [doi]

@inproceedings{Seo0LLYKK15,
  title = {Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction},
  author = {Sungyoul Seo and Yong Lee 0002 and Hyeonchan Lim and Joohwan Lee and Hongbom Yoo and Yojoung Kim and Sungho Kang},
  year = {2015},
  doi = {10.1109/ATS.2015.8},
  url = {http://dx.doi.org/10.1109/ATS.2015.8},
  researchr = {https://researchr.org/publication/Seo0LLYKK15},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015},
  publisher = {IEEE},
  isbn = {978-1-4673-9739-1},
}