Nelson Sepúlveda-Ramos, Jeffrey W. Teng, Harrison Lee 0002, John D. Cressler. Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. In 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2022, Phoenix, AZ, USA, October 16-19, 2022. pages 62-65, IEEE, 2022. [doi]
Abstract is missing.