Checking the Paths to Identify Mutant Application on Embedded Systems

Ahmadou Al Khary Séré, Julien Iguchi-Cartigny, Jean-Louis Lanet. Checking the Paths to Identify Mutant Application on Embedded Systems. In Tai-Hoon Kim, Young Hoon Lee, Byeong Ho Kang, Dominik Slezak, editors, Future Generation Information Technology - Second International Conference, FGIT 2010, Jeju Island, Korea, December 13-15, 2010. Proceedings. Volume 6485 of Lecture Notes in Computer Science, pages 459-468, Springer, 2010. [doi]

@inproceedings{SereIL10,
  title = {Checking the Paths to Identify Mutant Application on Embedded Systems},
  author = {Ahmadou Al Khary Séré and Julien Iguchi-Cartigny and Jean-Louis Lanet},
  year = {2010},
  doi = {10.1007/978-3-642-17569-5_45},
  url = {http://dx.doi.org/10.1007/978-3-642-17569-5_45},
  researchr = {https://researchr.org/publication/SereIL10},
  cites = {0},
  citedby = {0},
  pages = {459-468},
  booktitle = {Future Generation Information Technology - Second International Conference, FGIT 2010, Jeju Island, Korea, December 13-15, 2010. Proceedings},
  editor = {Tai-Hoon Kim and Young Hoon Lee and Byeong Ho Kang and Dominik Slezak},
  volume = {6485},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-642-17568-8},
}