Low-cost EVM built-in test of RF transceivers

Ayssar Serhan, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir. Low-cost EVM built-in test of RF transceivers. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 51-54, IEEE, 2014. [doi]

Abstract

Abstract is missing.