Yiorgos Sfikas, Yiorgos Tsiatouhas. Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing. In Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, April 15-17, 2009, Liberec, Czech Republic. pages 108-113, IEEE Computer Society, 2009. [doi]
Abstract is missing.