Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits - researchr publication

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Bassam Shaer. Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits. In 2004 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2004), Emerging Trends in VLSI Systems Design, 19-20 February 2004, Lafayette, LA, USA. pages 289-290, IEEE Computer Society, 2004. [doi]

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