A built-in self-test technique for transmitter-only systems

Maryam Shafiee, Jennifer N. Kitchen, Sule Ozev. A built-in self-test technique for transmitter-only systems. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]

Abstract

Abstract is missing.