Saeed Shamshiri, Kwang-Ting Cheng. Error-locality-aware linear coding to correct multi-bit upsets in SRAMs. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 202-211, IEEE, 2010. [doi]
Abstract is missing.