Kaveh Shamsi, Meng Li 0004, David Z. Pan, Yier Jin. KC2: Key-Condition Crunching for Fast Sequential Circuit Deobfuscation. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 534-539, IEEE, 2019. [doi]
Abstract is missing.