On Path-Wise Automatic Generation of Test Data for Both White-Box and Black-Box Testing - researchr publication

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Jinhui Shan, Ji Wang, Zhichang Qi. On Path-Wise Automatic Generation of Test Data for Both White-Box and Black-Box Testing. In 8th Asia-Pacific Software Engineering Conference (APSEC 2001), 4-7 December 2001, Macau, China. pages 237, IEEE Computer Society, 2001. [doi]

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