An Efficient Method to Identify Untestable Path Delay Faults - researchr publication

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Yun Shao, Sudhakar M. Reddy, Seiji Kajihara, Irith Pomeranz. An Efficient Method to Identify Untestable Path Delay Faults. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 233-238, IEEE Computer Society, 2001. [doi]

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