Degradation Modeling With Long-Term Memory Considering Measurement Errors

Yunfei Shao, Wujun Si. Degradation Modeling With Long-Term Memory Considering Measurement Errors. IEEE Transactions on Reliability, 72(1):177-189, March 2023. [doi]

Authors

Yunfei Shao

This author has not been identified. Look up 'Yunfei Shao' in Google

Wujun Si

This author has not been identified. Look up 'Wujun Si' in Google