Degradation Modeling With Long-Term Memory Considering Measurement Errors

Yunfei Shao, Wujun Si. Degradation Modeling With Long-Term Memory Considering Measurement Errors. IEEE Transactions on Reliability, 72(1):177-189, March 2023. [doi]

@article{ShaoS23,
  title = {Degradation Modeling With Long-Term Memory Considering Measurement Errors},
  author = {Yunfei Shao and Wujun Si},
  year = {2023},
  month = {March},
  doi = {10.1109/TR.2021.3125958},
  url = {https://doi.org/10.1109/TR.2021.3125958},
  researchr = {https://researchr.org/publication/ShaoS23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Reliability},
  volume = {72},
  number = {1},
  pages = {177-189},
}