Kanuj Sharma, Simon Kamm, Valentyna Afanasenko, Kevin Muñoz Barón, Ingmar Kallfass. Non-Destructive Failure Analysis of Power Devices via Time- Domain Reflectometry. In 17th IEEE International Conference on Automation Science and Engineering, CASE 2021, Lyon, France, August 23-27, 2021. pages 423-428, IEEE, 2021. [doi]
Abstract is missing.