CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization

Kaship Sheikh, Shu-Jen Han, Lan Wei. CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization. IEEE Trans. on Circuits and Systems, 63-I(12):2209-2221, 2016. [doi]

Abstract

Abstract is missing.