Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai, Xianlong Hong. Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. In Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009. pages 161-166, IEEE, 2009. [doi]
Abstract is missing.