Defect consideratons for robust sparse coding using memristor arrays

Patrick Sheridan, Wei D. Lu. Defect consideratons for robust sparse coding using memristor arrays. In Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2015, Boston, MA, USA, July 8-10, 2015. pages 137-138, IEEE, 2015. [doi]

Abstract

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