Jiahe Shi, Zhengqi Gao, Jun Tao 0001, Yangfeng Su, Dian Zhou, Xuan Zeng 0001. Multi-Corner Parametric Yield Estimation via Bayesian Inference on Bernoulli Distribution with Conjugate Prior. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.