Testing delay faults in asynchronous handshake circuits

Feng Shi, Yiorgos Makris. Testing delay faults in asynchronous handshake circuits. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 193-197, ACM, 2006. [doi]

Abstract

Abstract is missing.