L. Shi, Stoyan N. Nihtianov, F. Scholze, Lis K. Nanver. Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application. In 38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012, Montreal, QC, Canada, October 25-28, 2012. pages 3952-3957, IEEE, 2012. [doi]
@inproceedings{ShiNSN12,
title = {Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application},
author = {L. Shi and Stoyan N. Nihtianov and F. Scholze and Lis K. Nanver},
year = {2012},
doi = {10.1109/IECON.2012.6389260},
url = {https://doi.org/10.1109/IECON.2012.6389260},
researchr = {https://researchr.org/publication/ShiNSN12},
cites = {0},
citedby = {0},
pages = {3952-3957},
booktitle = {38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012, Montreal, QC, Canada, October 25-28, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2419-9},
}