Wire sizing with scattering effect for nanoscale interconnection

Sean X. Shi, David Z. Pan. Wire sizing with scattering effect for nanoscale interconnection. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 503-508, IEEE, 2006. [doi]

Abstract

Abstract is missing.